Structural and ferroelectric properties of epitaxial Bi5Ti3FeO15 and natural-superlattice-structured Bi4Ti3O12–Bi5Ti3FeO15 thin films

Abstract

Bismuth-layer-structured multiferroic Bi5Ti3FeO15 (BTFO15) (number of pseudoperovskite blocks, m=4) and natural-superlattice-structured Bi4Ti3O12–Bi5Ti3FeO15 (BIT-BTFO15) (m=3 or 4) thin films were prepared on (001)-oriented and (110)-oriented La-doped (3.73 wt %) SrTiO3 (La-STO) single-crystal substrates using pulsed laser deposition. X-ray diffraction patterns of these thin films on (001) La-STO single crystals indicated that the obtained thin films were single-phase (00l)-oriented layered perovskite, and that the BIT-BTFO15 (m=3 or 4) natural-superlattice structure was also obtained. On (110) La-STO single crystal, layered perovskite (11l)-oriented thin films were also obtained. Moreover, cross-sectional transmission electron microscope images of these thin films revealed four pseudoperovskite blocks (m=4) in the BTFO15 thin films, and an intergrowth structure of three and four pseudoperovskite blocks (m=3 or 4) in BIT-BTFO15 sandwiched by two (Bi2O2)2+ layers. In ferroelectric D-E hysteresis loop measurements, BTFO15 (m=4) and BIT-BTFO15 (m=3 or 4) thin films on (110) La-doped STO single crystals produced clear ferroelectric hysteresis loops with double remanent polarizations (2Pr) of 49 μC/cm2 and 44 μC/cm2, respectively. However, BTFO15 and BIT-BTFO15 thin films on (001) La-doped STO single crystals had paraelectric characteristics. These results demonstrate that the spontaneous polarization vectors of the BTFO15 and BIT-BTFO15 thin films were parallel to the a axis of their unit cells.