Publication | Closed Access
Picosecond photoelectric characteristic in La0.7Sr0.3MnO3∕Si p-n junctions
101
Citations
11
References
2005
Year
Optical MaterialsEngineeringLaser ScienceLaser ApplicationsLaser MaterialOptoelectronic DevicesUltrafast Photoelectric EffectHigh-power LasersPhotovoltaicsSemiconductorsPhotoelectric SensorElectronic DevicesUltrafast Photoelectric EffectsPulse PowerPulsed Laser DepositionPhysicsRelativistic Laser-matter InteractionUltrafast Laser PhysicsSemiconductor MaterialPhotoelectric MeasurementPicosecond Photoelectric CharacteristicCo2 Laser PulseApplied PhysicsUltrafast OpticsOptoelectronics
Ultrafast photoelectric effects have been observed in La0.7Sr0.3MnO3∕Si p-n junctions fabricated by laser molecular-beam epitaxy. The rise time was ∼210ps and the full width at half-maximum was ∼650ps for the photovoltaic pulse when the junction was irradiated by a 1064nm laser pulse of 25ps duration. The photovoltaic sensitivity was as large as 435mV∕mJ for a 1064nm laser pulse. No such photovoltaic signal was observed with irradiation from a 10.6μm CO2 laser pulse. The results reveal that this phenomenon is an ultrafast photoelectric effect.
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