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Local retention behaviors of epitaxial and polycrystalline PbMg1∕3Nb2∕3O3–PbTiO3 thin films by scanning force microscopy
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Citations
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References
2007
Year
EngineeringForce MicroscopyThin Film Process TechnologyPmn-pt Thin FilmsFerroelectric ApplicationSro ElectrodesMolecular Beam EpitaxyEpitaxial GrowthThin Film ProcessingMaterials ScienceCrystalline DefectsMaterial AnalysisGrain GrowthSurface ScienceApplied PhysicsFerroelectric MaterialsThin FilmsFunctional MaterialsLocal Retention Behaviors
The authors report the results of retention in epitaxial and polycrystalline PbMg1∕3Nb2∕3O3–PbTiO3 (PMN-PT) thin films on SrRuO3 (SRO) and Pt. The SRO electrodes were deposited by pulsed laser deposition and the PMN-PT thin films were coated by a sol-gel method. Local poling behaviors of the PMN-PT domains were investigated as a function of time in both single-poled and reverse-poled regions by scanning force microscopy. An extended exponential decay is observed in the PMN-PT/SRO heterostructures while a fluctuated relaxation is shown in the PMN-PT/Pt films, suggesting that crystal orientation and grain growth is critical to understand retention of relaxor ferroelectrics.
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