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Disorder–order phase transformation in a fluorite-related oxide thin film: In-situ X-ray diffraction and modelling of the residual stress effects

Materials ScienceMaterial AnalysisEngineeringOxide ElectronicsX-ray DiffractionApplied PhysicsCondensed Matter PhysicsDefect FormationDisorder–order Phase TransformationThin FilmsResidual Stress EffectsIn-situ X-ray DiffractionThin Film Processing