Concepedia

Publication | Closed Access

<title>Evaluation of NH<formula><inf><roman>4</roman></inf></formula>F/H<formula><inf><roman>2</roman></inf></formula>O<formula><inf><roman>2</roman></inf></formula> effectiveness as a surface passivation agent for Cd<formula><inf><roman>1-x</roman></inf></formula>Zn<formula><inf><roman>x</roman></inf></formula>Te crystals</title>

DOI

31

Citations

0

References

2000

Year

G. W. Wright, R. B. James, D. Chinn, B. A. Brunett, Richard W. Olsen, J.M. Van Scyoc, W. Miles Clift, A. Bürger, Kaushik Chattopadhyay, D. T. Shi,
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

Abstract

Various passivating agents that reduce the surface leakage current of CZT crystals have been previously reported. In none of the studies, NH<SUB>4</SUB>F/H<SUB>2</SUB>O<SUB>2</SUB> was identified as a promising passivation agent for CZT. We now present a study that includes the effect of NH<SUB>4</SUB>F/H<SUB>2</SUB>O<SUB>2</SUB> treatment on the surface properties and detector performance. An elemental depth profile was obtained via Auger Electron Spectroscopy. Furthermore, X-ray Photoelectron Spectroscopy acquired at different processing times to identify the chemical states of the elemental species that composed the dielectric layer. It was found that the NH<SUB>4</SUB>F/H<SUB>2</SUB>O<SUB>2</SUB> surface passivation significantly improved the sensitivity and energy resolution of CZT detectors. Furthermore, the NH<SUB>4</SUB>F/H<SUB>2</SUB>O<SUB>2</SUB> treatment did not attack the Au electrodes, which eliminated the need to protect the contacts in the detector fabrication process.