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Optical properties of SrMoO3 thin film
43
Citations
4
References
2000
Year
Materials ScienceOptical MaterialsEngineeringMaterial AnalysisOptical PropertiesOxide ElectronicsOptical GlassApplied PhysicsRf MagnetronSrmoo3 Thin FilmThin Film Process TechnologyThin FilmsThin Film ProcessingReflectivity Values
We used an rf magnetron reactive sputtering method to prepare SrMoO3 thin film on a silica glass substrate and evaluated its optical properties. The reflectivity of the blue-colored film showed a cutoff due to plasmon at ∼1.7 eV. From a Kramers–Kronig analysis of the reflectivity, the spectral dependence of dielectric constants and optical constants were obtained. They agreed in tendency with the constants determined by spectroscopic ellipsometry. The plasma frequency due to free carriers (4.5 eV) was obtained by application of a Drude model to reflectivity values, which showed that the effective mass of the conduction carrier was m*=2.1m0, where m0 is the free electron mass.
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