Publication | Closed Access
Low‐Dimensional Structure Vacuum‐Ultraviolet‐Sensitive (<i>λ</i> < 200 nm) Photodetector with Fast‐Response Speed Based on High‐Quality AlN Micro/Nanowire
252
Citations
40
References
2015
Year
Aluminium NitrideEngineeringHigh-quality Aluminum NitridePhoton DetectionOptoelectronic DevicesVacuum DevicePhotoelectric SensorPhotodetectorsNanoelectronicsOptical PropertiesHigh‐quality Aln Micro/nanowirePhotonicsElectrical EngineeringLow‐dimensional Structure Vacuum‐ultraviolet‐sensitivePhysicsPhotoelectric MeasurementFast‐response SpeedPhotonic DeviceLow-dimensional-structure Vacuum-ultraviolet-sensitive PhotodetectorApplied PhysicsOptoelectronics
A low-dimensional-structure vacuum-ultraviolet-sensitive photodetector based on high-quality aluminum nitride (AlN) micro-/nanowires is reported. This work, for the first time, demonstrates that a semiconductor nanostructure can be applied in vacuum-ultraviolet (VUV) photon detection and opens a way for developing diminutive, power-saving, and low-cost VUV materials and sensors that can be potentially applied in geospace sciences and solar-terrestrial physics.
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