Magnetic Microprobe design for EM fault attack

Abstract

Fault attacks constitute a threat against secure integrated circuits. If they can be conducted by different means, a large attention has recently been paid to the EM side-channel. EM fault attacks are performed through near-field probes. To be efficient, these probes must deliver an intense and localized field. Using 3-D electromagnetic simulations, this paper proposes guidelines for the design of an efficient magnetic probe excited by a pulse signal.