A Bayesian Zero-Failure (BAZE) Reliability Demonstration Testing Procedure

Abstract

A Bayesian Zero-Failure (BAZE) reliability demonstration testing procedure is presented. The method is developed for an exponential failure-time model and a gamma prior distribution on the failure rate. The method provides the required total fixed test time, according to a single posterior risk criterion, that is required in order to pass a test in which no failures are observed. A simple approach using percentiles is used to select a prior distribution. The step-by-step method is easily applied in practice and an example is given.