Physica Scripta · 2012 · 17 citations · 11 references
Natural SciencesMaterials EngineeringMaterials ScienceCeramic MaterialsCeramicsMaterials CharacterizationDielectric CeramicsElectrical Properties Of CeramicsFerroelectric CeramicsInorganic MaterialsPiezoelectric CeramicsRare-earth-doped MaterialsDielectric ConstantDoping Effects On Electrical PropertiesElectrical PropertiesElectromechanical CouplingElectromechanical Coupling CoefficientLattice ParametersPiezoelectric PropertiesX-ray Diffraction Analysis
The four-layer Aurivillius compound SrBi4−xDyxTi4O15 (x = 0.02 − 0.1) was synthesized by using a solid state sintering method. X-ray diffraction (XRD) analysis revealed that the dysprosium-substituted SrBi4Ti4O15 ceramics have a pure four-layer Aurivillius-type structure. The lattice parameters and densities were calculated with XRD studies. The experimental densities obtained were about 95% that of theoretical values. The effects of dysprosium oxide on the microstructure, ferroelectric, dielectric and piezoelectric properties of the ceramics were investigated. The dielectric constant of Dy-doped samples was found to decrease with increasing Dy content. At x = 0.06, the piezoelectric charge coefficient (d33) and the electromechanical coupling factor (kp) were found to be maximum.
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Doping effect on the dielectric property in bismuth titanate
Yanqiu Yao, Chunhua Song, Dong Su et al. · Journal of Applied Physics · 2004 · 196 citations · Full text