Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1993 · 33 citations · 0 references
EngineeringElectrical EngineeringMicroelectronicsRadiation DetectionRadiation MeasurementDetector TechnologyEnergy ResolutionRadiation DetectorsRadiation SpectroscopySemiconductor DetectorsX-ray DetectorsDetector CoolingDetector Cooling SystemsDetector Energy ResolutionDetectorsRadiation Energy ResolutionSemiconductor Detector Resolution
Preliminary investigations were carried out to evaluate the resolution of Cd<SUB>1-x</SUB>Zn<SUB>x</SUB>Te detectors at temperatures achievable with commercially available, low power Peltier refrigerators. Detectors were in the form of cubes, 2 mm on a side. They were tested using a preamplifier with optical feedback. The input FET was cooled along with the detectors. Resolutions of 409 eV and 326 eV were observed at the 5.9 keV line of Fe-55, at temperatures of -10 degree(s)C and -20 degree(s)C, respectively. Results indicate that a straightforward extension of this work will lead to resolutions well below 200 eV.