Applied Physics Letters · 2008 · 379 citations · 27 references
Natural SciencesMaterials SciencePhysicsMaterials PhysicsSolid State PhysicsThin FilmsOptical Thin FilmsOxide SemiconductorsPerovskite MaterialsThin Film Optical PropertiesBand GapDirect Band GapEllipsometryEpitaxial Thin FilmsMolecular Beam EpitaxyOptical Band GapSpectroscopic EllipsometryThermodynamic Analysis
Bi Fe O 3 thin films have been deposited on (001) SrTiO3 substrates by adsorption-controlled reactive molecular-beam epitaxy. For a given bismuth overpressure and oxygen activity, single-phase BiFeO3 films can be grown over a range of deposition temperatures in accordance with thermodynamic calculations. Four-circle x-ray diffraction reveals phase-pure, epitaxial films with ω rocking curve full width at half maximum values as narrow as 29arcsec (0.008°). Multiple-angle spectroscopic ellipsometry reveals a direct optical band gap at 2.74eV for stoichiometric as well as 5% bismuth-deficient single-phase BiFeO3 films.
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Epitaxial BiFeO <sub>3</sub> Multiferroic Thin Film Heterostructures
Junling Wang, Jeffrey B. Neaton, Haimei Zheng et al. · Science · 2003 · 6.2K citations · Full text
Natural Sciences, Materials Engineering, Materials Science +17
Thermo-Calc & DICTRA, computational tools for materials science
J. Y. Andersson, Thomas Helander, Lars Höglund et al. · Calphad · 2002 · 4.2K citations
Natural Sciences, Materials Engineering, Materials Science +13
G. A. Smolenskiǐ, I. E. Chupis · Soviet Physics Uspekhi · 1982 · 1.2K citations