Publication | Closed Access
Influence of the technology on the destruction effects of semiconductors by impact of EMP and UWB pulses
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Citations
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References
2003
Year
Different Logic DevicesElectrical EngineeringEngineeringElectronic EngineeringUwb PulsesBias Temperature InstabilityTime-dependent Dielectric BreakdownComputer EngineeringMicroelectronicsDestruction EffectsElectromagnetic Compatibility
In this paper the influence of TTL- and CMOS-technology on the destruction effects of semiconductors by impact of EMP and UWB pulses is determined. Different logic devices like NANDs and inverters were exposed to high amplitude transient pulses.
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