Publication | Closed Access
Negative Bias Temperature Instability In Poly-Si TFTs
14
Citations
8
References
1993
Year
Unknown Venue
Non-volatile MemoryElectrical EngineeringKey TechnologiesEngineeringPhysicsNanoelectronicsBias Temperature InstabilityApplied PhysicsCondensed Matter PhysicsMemory DeviceMega-bit SramSemiconductor MemorySilicon On InsulatorMicroelectronicsPoly-si TftsSilicon Debugging
Polycrystalline silicon thin film transistors (poly-Si TFTs) have become one of key technologies of mega-bit SRAM with high stability memory cells and a low standby current.
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