Reset noise suppression in two-dimensional CMOS photodiode pixels through column-based feedback-reset

Abstract

We present a new CMOS photodiode imager pixel with ultralow read noise through on-chip suppression of reset noise via column-based feedback circuitry. In a 0.5 /spl mu/m CMOS process, the pixel occupies only 10/spl times/10 /spl mu/m/sup 2/ area. Data from a 256/sup 2/ CMOS imager indicates imager operation with read noise as low as 6 electrons without employing on- or off-chip correlated double sampling. The noise reduction is achieved without introducing any image lag, and with insignificant reduction in quantum efficiency and full-well.