Publication | Closed Access
Setting limits on the accuracy of X-ray determination of Al concentration in epitaxial layers
21
Citations
36
References
1997
Year
Materials ScienceMaterials EngineeringAluminium NitrideX-ray SpectroscopyEngineeringX-ray DiffractionApplied PhysicsAl ConcentrationEpitaxial LayersInstrumentationEpitaxial GrowthX-ray DeterminationMicrostructure
| Year | Citations | |
|---|---|---|
Page 1
Page 1