Element-Specific Magnetic Microscopy with Circularly Polarized X-rays

Abstract

Circularly polarized soft x-rays have been used with an imaging photoelectron microscope to record images of magnetic domains at a spatial resolution of 1 micrometer. The magnetic contrast, which can be remarkably large, arises from the fact that the x-ray absorption cross section at inner-shell absorption edges of aligned magnetic atoms depends on the relative orientation of the photon spin and the local magnetization direction. The technique is element-specific, and, because of the long mean free paths of the x-rays and secondary electrons, it can record images of buried magnetic layers.