Circuit yield of organic integrated electronics

Eugenio Cantatore, C.M. Hart, M. Digioia, Gerwin H. Gelinck, Tom C. T. Geuns, H. E. A. Huitema, Laurens Schrijnemakers, E. van Veenendaal, D.M. de Leeuw

2003 · 17 citations · 11 references

Concepts

Abstract

Research on organic electronics is focussed on materials and on the performance of discrete devices. Reliability and circuit yield is largely unexplored. Yield, based on measurements on digital organic circuits up to 1000 transistors, is described. The causes of yield loss are analyzed and design solutions to improve the yield are discussed.

References

11