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The influence of the top-contact metal on the ferroelectric properties of epitaxial ferroelectric Pb(Zr0.2Ti0.8)O3 thin films
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Citations
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References
2008
Year
Materials ScienceElectrical EngineeringEpitaxial GrowthEngineeringTop-contact MetalFerroelectric ApplicationOxide ElectronicsApplied PhysicsSemiconductor MaterialBottom Srruo3 ElectrodeThin FilmsFerroelectric PropertiesPyroelectricityO3 Thin FilmsTop ContactDielectric Hysteresis
Electrical properties, i.e., dielectric hysteresis and leakage current, of epitaxial Pb(Zr0.2Ti0.8)O3 films with bottom SrRuO3 electrode and different metals as top contact were investigated. The leakage current is largely insensitive to the work function of the top metal but increases with decreasing electronegativity as well as with decreasing number of electrons on the d-shell of the top metal. The best rectifying properties are obtained for metals with complete d-shell (Cu, Au, Ag, Pd), while the metals with few electrons on the d-shell (Ta, Cr) form Ohmic-like contacts.
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