Advances in X-ray Analysis · 1974 · 40 citations · 25 references
Natural SciencesMaterials EngineeringMaterials ScienceCrystal StructureMaterials CharacterizationMechanical Behavior Of MaterialsPlastic DeformationResidual StressStress AnalysisStress-strain BehaviorX-ray CrystallographyX-ray DiffractionExperimental Stress AnalysisInterplanar SpacingPlastic Stress AnalysisResidual Stress AnalysisResidual Stress CharacterizationResidual Stress DeterminationResidual Stress MeasurementX-ray Diffraction Analysis
Abstract Residual stresses are expected to lead to a linear dependence of the interplanar spacing, d, on sin 2 ψ (where ψ is the sample tilt) and the stress can be obtained from the slope of this line, As a result of the linear dependence a two-tilt method is often employed to obtain the stress. However, when a specimen is subjected to extensive plastic deformation large deviations from a straight line can occur and a two-point method can lead to an erroneous stress determination. The results reported here show that: (1) this is more likely to occur in homogeneous materials than in multiphase materials (2) the oscillations follow closely the variation in peak intensity due to texture (3) the oscillations are caused by microstresses which are due to an "orientation" effect as suggested by Weidemann, A simple, easy-to-use procedure has been developed and tested to correct the data and obtain the correct macrostress.
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Elements of X-Ray Diffraction.
N. W. Gregory · Journal of the American Chemical Society · 1957 · 1.7K citations