Publication | Closed Access
A Fabry-Perot interferometer for sub-meV x-ray energy resolution (invited)
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Citations
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References
1996
Year
Optical MaterialsX-ray SpectroscopyEngineeringOptic DesignOptical TestingInterferometryPolycapillary OpticsFpi ResonancesX-ray ImagingCalibrationOptical PropertiesX-ray TechnologyInstrumentationOptical SystemsRadiation ImagingHealth SciencesPhotonicsPhysicsOptical MeasurementFabry-perot InterferometerSynchrotron RadiationOptical TheoryApplied PhysicsMirror ThicknessOptical SciencesOptical System AnalysisX-ray OpticDiffractive Optic
The optical theory of Fabry-Perot interferometers (FPIs) for x rays using dynamically diffracting thin perfect crystals as reflectors is developed. Application to a device using high diffraction orders in silicon crystals of thickness of the order of 100 μm or more shows that energy resolutions of the order of a tenth of a meV are achievable. The effect that various features, such as gap and mirror thickness, lattice mismatches, etc., have on the FPI resonances is studied.
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