Japanese Journal of Applied Physics · 2007 · 14 citations · 8 references
Natural SciencesMaterials EngineeringMaterials ScienceCeramic MaterialsNanomaterialsThin FilmsPerovskite MaterialsRare-earth-doped MaterialsElectron Diffraction Pattern AnalysisFringe AnalysisHigh-resolution Electron MicroscopyHigh-resolution Transmission Electron MicroscopyPulsed Laser DepositionSelected Area Electron DiffractionX-ray Diffraction AnalysisYttrium Barium Copper Oxide Films
Microstructures of BaZrO3 (BZO) doped as artificial pinning centers in ErBa2Cu3O7-δ (ErBCO) films were studied by high-resolution transmission electron microscopy (HR-TEM). BZO-doped ErBCO films were grown by a pulsed laser deposition (PLD) method. In the HR-TEM observation, the presence of nanorods with 10 nm average diameter was confirmed from Moiré fringe analysis. The lattice constant of nanorods in the ErBCO was measured using a selected area electron diffraction pattern (SAEDP) as 0.416 nm, which was in good agreement with the lattice constant of BZO, 0.419 nm, provided by X-ray diffraction data. Moiré fringes were observed in both cross-sectional-view and plan-view of the HR-TEM images. The distances of the Moiré fringes were 2.07, 3.22, and 3.05 nm, and which corresponded to the 200, 006, and 110 reflections of the ErBCO matrix and the 200, 002, and 110 reflections of nanorods, respectively. It is suggested that BZO disperses in ErBCO film as nanorods.
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