Applied Physics Letters · 2003 · 70 citations · 7 references
Natural SciencesMaterials EngineeringMaterials ScienceCeramic MaterialsMagnetic MaterialsThin FilmsEpitaxial GrowthMagnetic CharacterizationMagnetic OxidesMagnetic Properties Of SolidsMagnetism In SolidsThin Film Magnetic PropertiesEpitaxial Thin FilmsFilm ThicknessFinite-size EffectsMagnetic PropertiesManganitesMean-field ApproximationSize EffectsThin Film Magnetism
We present a structural and magnetic study of La0.7Ca0.3MnO3 epitaxial films (the thickness ranges from 2.4 to 80 nm) on SrTiO3. Their structure, as obtained by x-ray diffraction, is orthorhombic with a 45° rotated 2×2 square lattice, referred to the SrTiO3 substrate, in the film plane. The 2.4 nm film adopts a different structure as evidenced by the extinction of particular diffraction peaks and supported by the behavior of the size of the in-plane structural domains. While no important structural changes are detected for the other films as the layer thickness is reduced, Tc decreases drastically while the remanent magnetization is constant. Tc follows the functional dependence of a mean field approximation for the limitation of the divergence of the spin–spin correlations by the film thickness.
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