Pixel-level fringing-effect model to describe the phase profile and diffraction efficiency of a liquid crystal on silicon device

Abstract

We propose a fringing-effect model based on the experimentally measured phase response across the phase transition region of a liquid crystal on silicon (LCOS) device. The measured phase profile in the phase transition region is characterized by a scaled error function of the flyback width. The flyback width can be determined by a cubic function of the phase depth between neighboring pixels. This dependence of the flyback width on the phase depth is explained by a linear rotation model of the liquid crystal director. The simulated diffraction efficiency based on the fringing-effect model shows a close agreement with the experimental measurement.