Quantitative characterization of the interface roughness of (GaIn)As quantum wells by high resolution STEM - Concepedia

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Quantitative characterization of the interface roughness of (GaIn)As quantum wells by high resolution STEM

10

Citations

17

References

2015

Year

Haoxue Han, Andreas Beyer, K. Jandieri, Katharina Gries, Lennart Duschek, W. Stolz, Kerstin Volz

References

	Year	Citations

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