Seagate (United Kingdom)

Atomic scale structure of sputtered metal multilayers

Xiaowang Zhou, H.N.G. Wadley, R. A. Johnson et al. · Acta Materialia · 2001 · 774 citations

Materials Science, Surface Characterization, Engineering +6

Wafer-scale integration of group III–V lasers on silicon using transfer printing of epitaxial layers

John Justice, Chris Bower, Matthew Meitl et al. · Nature Photonics · 2012 · 269 citations

Photonics, Wafer Scale Processing, Engineering +9

Advancements in hybrid energy storage systems for enhancing renewable energy-to-grid integration

Adekanmi Miracle Adeyinka, Oladapo Christopher Esan, Ahmed Olanrewaju Ijaola et al. · Sustainable Energy Research · 2024 · 133 citations · Full text

Commercial TMR heads for hard disk drives: characterization and extendibility at 300 gbit²

Sining Mao, Yonghua Chen, Feng Liu et al. · IEEE Transactions on Magnetics · 2006 · 118 citations

Magnetism, Electrical Engineering, Engineering +13

Impact of different Nd-rich crystal-phases on the coercivity of Nd–Fe–B grain ensembles

G. Hrkac, T.G. Woodcock, Keith T. Butler et al. · Scripta Materialia · 2013 · 103 citations

Materials Science, Magnetism, Ferromagnetism +12