TechFlow (United States)

Statistical Prediction and Measurement of Induced Voltages on Components Within Complicated Enclosures: A Wave-Chaotic Approach

Sameer Hemmady, Thomas M. Antonsen, Edward Ott et al. · IEEE Transactions on Electromagnetic Compatibility · 2012 · 82 citations

Field emission from laser cut CNT fibers and films

Steven B. Fairchild, John Bulmer, Martin Sparkes et al. · Journal of materials research/Pratt's guide to venture capital sources · 2013 · 26 citations

Applied Physics, Field Emission, Electro-optics Device

Experimental Verification of a Stochastic Topology Approach for High-Power Microwave Effects

Xin Li, Cui Meng, Yinong Liu et al. · IEEE Transactions on Electromagnetic Compatibility · 2015 · 20 citations

Experimental Verification, Engineering, Radio Frequency +18

Modeling timing variations in digital logic circuits due to electrical fast transients

Xu Gao, Chunchun Sui, Daryl G. Beetner et al. · 2013 · 13 citations · Full text

Digital Logic Circuits, Engineering, Computer Architecture +19

Development of Advanced Representative Particle Model-Application of DEM Simulation to Large-scale Powder Systems-

Mikio Sakai, Seiichi Koshizuka, Hiroshi Takeda · Journal of the Society of Powder Technology Japan · 2006 · 13 citations · Full text

Engineering, Fluid Mechanics, Mechanical Engineering +22