Y. Belkacem

Correlation between series resistance and parameters of Al/n-Si and Al/p-Si Schottky barrier diodes

M. Siad, A. Keffous, S Mamma et al. · Applied Surface Science · 2004 · 82 citations

Electrical Engineering, Engineering, Nanoelectronics +5

Effect of series resistance on the performance of high resistivity silicon Schottky diode

A. Keffous, M. Siad, S Mamma et al. · Applied Surface Science · 2003 · 40 citations

Electrical Engineering, Engineering, Nanoelectronics +5

CO2 and H2 detection with a CHx/porous silicon-based sensor

N. Gabouze, S. Belhousse, H. Cheraga et al. · Vacuum · 2006 · 33 citations

Chemical Engineering, Engineering, Sensors +5

Si-rich a-Si1−xCx thin films by d.c. magnetron co-sputtering of silicon and silicon carbide: Structural and optical properties

M.A. Ouadfel, A. Keffous, Amer Brighet et al. · Applied Surface Science · 2012 · 22 citations

Materials Science, Engineering, Optical Properties +7

Silicon carbide thin films with different processing growth as an alternative for energetic application

A.M. Ouadfel, A. Keffous, A. Kheloufi et al. · Optical Materials · 2016 · 19 citations

Materials Science, Materials Engineering, Engineering +7