Y.-H. Lee

Statistics

Publications

Citations

128

H-Index

Active since

2013

Affiliations

Taiwan Semiconductor Manufacturing Company (Taiwan)(Current)

Y.-H. Lee is an author at Taiwan Semiconductor Manufacturing Company (Taiwan) specializing in device reliability, semiconductor reliability, and reliability degradation mechanisms.

Publications per year

2013–2014

Publications

Self-heating effect in FinFETs and its impact on devices reliability characterization

S. E. Liu, J. S. Wang, Ying-Ta Lu et al. · 2014 · 114 citations

Engineering, Electrical Engineering, Electronic Materials +15

Re-investigation of frequency dependence of PBTI/TDDB and its impact on fast switching logic circuits

YH Huang, T.-Y. Yew, W. Wang et al. · 2013 · 14 citations

Engineering, Computer Engineering, Electrical Engineering +15

1–2 of 2