Statistics
Publications
1
Citations
12
H-Index
1
Active since
2004
Affiliations
Jie Shao is an author at National Yang Ming Chiao Tung University specializing in gate oxide reliability, engineering, and reliability degradation.
Publications per year
2004–2004
1
1
Hot carrier degradation in LDMOS power transistors
Chih-Chang Cheng, Jing-Yuan Wu, C.C. Lee et al. · 2004 · 12 citations
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