Brian V. Smith

A dedicated superbend x-ray microdiffraction beamline for materials, geo-, and environmental sciences at the advanced light source

Martin Kunz, Nobumichi Tamura, Kai Chen et al. · Review of Scientific Instruments · 2009 · 170 citations · Full text

Natural Sciences, Materials Science, Physics +13

High-efficiency <i>in situ</i> resonant inelastic x-ray scattering (iRIXS) endstation at the Advanced Light Source

Ruimin Qiao, Qinghao Li, Zengqing Zhuo et al. · Review of Scientific Instruments · 2017 · 134 citations · Full text

Natural Sciences, Chemistry, Materials Science +13

Sub-microradian surface slope metrology with the ALS Developmental Long Trace Profiler

Valeriy V. Yashchuk, Samuel K. Barber, Edward E. Domning et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2009 · 101 citations

Engineering, Hydrology, Metrology +7

Modular soft x-ray spectrometer for applications in energy sciences and quantum materials

Yi‐De Chuang, Yu-Cheng Shao, Alejandro Cruz et al. · Review of Scientific Instruments · 2017 · 82 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +16

Methodology for optimal<i>in situ</i>alignment and setting of bendable optics for nearly diffraction-limited focusing of soft x-rays

Daniel J. Merthe, Valeriy V. Yashchuk, Kenneth A. Goldberg et al. · Optical Engineering · 2013 · 18 citations · Full text

Natural Sciences, Physics, Biomedical Optics +14