R. Ralich

Electrostatic nanolithography in polymers using atomic force microscopy

Sergei F. Lyuksyutov, Richard A. Vaia, Pavel Paramonov et al. · Nature Materials · 2003 · 180 citations

Materials Science, Engineering, Beam Lithography +7

CMS Physics : Technical Design Report Volume 1: Detector Performance and Software

G.L. Bayatian, A. Korablev, A. Soha et al. · CERN Document Server (European Organization for Nuclear Research) · 2006 · 107 citations

Engineering, Radiation Detection, Physics +9

Peculiarities of an anomalous electronic current during atomic force microscopy assisted nanolithography on n-type silicon

Sergei F. Lyuksyutov, Pavel Paramonov, Ivan Dolog et al. · Nanotechnology · 2003 · 57 citations

Atomic Force Microscopy, Engineering, Electron-beam Lithography +21

Design, performance, and calibration of CMS hadron-barrel calorimeter wedges

S. Abdullin, V. Abramov, B. S. Acharya et al. · The European Physical Journal C · 2008 · 49 citations · Full text

Engineering, Nuclear Physics, Measurement +16

Transverse-Momentum and Pseudorapidity Distributions of Charged Hadrons in p p Collisions at s = 7 TeV

V. Khachatryan, A. M. Sirunyan, A. Tumasyan et al. · LA Referencia (Red Federada de Repositorios Institucionales de Publicaciones Científicas) · 2010 · 40 citations · Full text