Kaiyan He

Investigation of HfO2 Thin Films on Si by X-ray Photoelectron Spectroscopy, Rutherford Backscattering, Grazing Incidence X-ray Diffraction and Variable Angle Spectroscopic Ellipsometry

Xuguang Luo, Yao Li, Hong Yang et al. · Crystals · 2018 · 90 citations · Full text

Materials Science, Materials Engineering, Chemical Engineering +15

Surface/structural characteristics and band alignments of thin Ga2O3 films grown on sapphire by pulse laser deposition

Hong Yang, Yingda Qian, Chi Zhang et al. · Applied Surface Science · 2019 · 86 citations

Materials Science, Epitaxial Growth, Surface/structural Characteristics +10

Comparative spectroscopic studies of MOCVD grown AlN films on Al2O3 and 6H–SiC

Junhua Yin, Daihua Chen, Hong Yang et al. · Journal of Alloys and Compounds · 2020 · 52 citations

Materials Engineering, Comparative Spectroscopic Studies, Materials Science +6

Surface, structural and optical properties of AlN thin films grown on different face sapphire substrates by metalorganic chemical vapor deposition

Yao Li, Chi Zhang, Xuguang Luo et al. · Applied Surface Science · 2018 · 40 citations

Materials Science, Aluminium Nitride, Optical Materials +9

Effects of growth temperature and thickness on structure and optical properties of Ga2O3 films grown by pulsed laser deposition

Hong Yang, Yao Liu, Xuguang Luo et al. · Superlattices and Microstructures · 2019 · 30 citations

Materials Science, Optical Materials, Growth Temperature +10