3
Publications
83
Citations
3
H-Index
2006
Active since
Affiliations
E. Reid is an author at Scanimetrics (Canada) specializing in microelectronics, electronic packaging, and software testing.
Top concepts
EngineeringInstrumentationMicroelectronicsSoftware TestingBuilt-in Self-testDesign For TestingComputer EngineeringElectronic PackagingElectrical EngineeringElectromagnetic Compatibility
Publications per year
2006–2008
3
3
Non-contact wafer probe using wireless probe cards
C. Sellathamby, M. Reja, Lin Fu et al. · 2006 · 48 citations
High throughput non-contact SiP testing
B. Moore, C. Sellathamby, Philippe Cauvet et al. · 2007 · 24 citations
Non-contact Testing for SoC and RCP (SIPs) at Advanced Nodes
B. Moore, Marc Mangrum, C. Sellathamby et al. · 2008 · 11 citations
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