Statistics
Publications
1
Citations
27
H-Index
1
Active since
1974
Affiliations
Texas Instruments (United States)(Current)
Tont Dan George is an author at Texas Instruments (United States) specializing in degradation monitoring, semiconductor reliability, and reliability degradation mechanisms.
Publications per year
1974–1974
1
1
Elements of semiconductor-device reliability
C.G. Peattie, John Adams, Steve Carrell et al. · Proceedings of the IEEE · 1974 · 27 citations
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