S. C. Chien

The observation of trapping and detrapping effects in high-k gate dielectric MOSFETs by a new gate current Random Telegraph Noise (IG-RTN) approach

Chian-Sern Chang, Steve S. Chung, Y. S. Hsieh et al. · 2008 · 59 citations

Device Modeling, Electrical Engineering, Oxide Quality +14

RF passive devices on Si with excellent performance close to ideal devices designed by electro-magnetic simulation

Albert Chin, K.T. Chan, Chao-Jen Huang et al. · 2004 · 37 citations

Engineering, Radio Frequency, Excellent Performance +16

Remote and onsite scoring of OSCEs using generalisability theory: A three-year cohort study

Te-Chuan Chen, Meng-Chih Lin, Yuan-Cheng Chiang et al. · Medical Teacher · 2018 · 24 citations · Full text

Evolution of structural order in germanium ion-implanted amorphous silicon layers

S. L. Cheng, Hsin‐Hon Lin, Jr‐Hau He et al. · Journal of Applied Physics · 2002 · 20 citations

Materials Engineering, Materials Science, Ion Implantation +13

The minimum noise figure and mechanism as scaling RF MOSFETs from 0.18 to 0.13 μm technology nodes

Chuncheng Huang, K.T. Chan, C.Y. Chen et al. · 2003 · 19 citations

Engineering, Gate Resistance, Electromagnetic Compatibility +17