Statistics
Publications
78
Citations
6.1K
H-Index
31
Active since
1987
Jeffrey W. Beeman is an author at Lawrence Berkeley National Laboratory specializing in materials science, natural sciences, and semiconductor materials.
Publications per year
1987–2021
78
78
The Multiband Imaging Photometer for <i>Spitzer</i> (MIPS)
G. H. Rieke, Erick T. Young, C. W. Engelbracht et al. · The Astrophysical Journal Supplement Series · 2004 · 2.1K citations · Full text
Soo Hong Lee, John C. Lin, Maryam Farmand et al. · Journal of the American Chemical Society · 2020 · 354 citations · Full text
Natural Sciences, Materials Engineering, Materials Science +17
Diluted II-VI Oxide Semiconductors with Multiple Band Gaps
K. M. Yu, W. Walukiewicz, Junqiao Wu et al. · Physical Review Letters · 2003 · 294 citations · Full text
Natural Sciences, Materials Engineering, Materials Science +17
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