C. Y. Hong

Memory effects related to deep levels in metal–oxide–semiconductor structure with nanocrystalline Si

Young Hae Kwon, C. J. Park, W. C. Lee et al. · Applied Physics Letters · 2002 · 53 citations

Engineering, Materials Engineering, Materials Science +17

Deep level defects in porous silicon

W.H Lee, Chaehun Lee, Yongchai Kwon et al. · Solid State Communications · 2000 · 14 citations

Engineering, Materials Engineering, Materials Science +14

Diminution of the surface states on GaAs by a sulfur treatment

Y. T. Oh, Seong-Chan Byun, B. R. Lee et al. · Journal of Applied Physics · 1994 · 12 citations

Engineering, Materials Engineering, Materials Science +17

Mössbauer effect measurement of the recoil-free fraction for 57Fe implanted in a nanophase diamond film

T. W. Sinor, J. Standifird, F. Davanloo et al. · Applied Physics Letters · 1994 · 11 citations

Natural Sciences, Materials Engineering, Materials Science +16

Deep level defects of InAs quantum dots grown on GaAs by molecular beam epitaxy

C.J Park, Hae-Yong Kim, Y.-H. Lee et al. · Journal of Crystal Growth · 2001 · 11 citations

Natural Sciences, Materials Science, Physics +16