Statistics
Publications
1
Citations
27
H-Index
1
Active since
1974
Affiliations
Texas Instruments (United States)(Current)
M.H. Valek is an author at Texas Instruments (United States) specializing in reliability assurance, reliability modeling, and semiconductor device characterization.
Publications per year
1974–1974
1
1
Elements of semiconductor-device reliability
C.G. Peattie, John Adams, Steve Carrell et al. · Proceedings of the IEEE · 1974 · 27 citations
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