Yong Bin Lee

Preparation and characterization of ferroelectric Hf_0.5Zr_0.5O₂thin films grown by reactive sputtering

Young Hwan Lee, Han‐Joon Kim, Taehwan Moon et al. · Nanotechnology · 2017 · 109 citations

Natural Sciences, Materials Engineering, Materials Science +17

Nucleation‐Limited Ferroelectric Orthorhombic Phase Formation in Hf_0.5Zr_0.5O₂ Thin Films

Young Hwan Lee, Seung Dam Hyun, Hae Jin Kim et al. · Advanced Electronic Materials · 2018 · 83 citations

Natural Sciences, Materials Science, Physics +17

Voltage Drop in a Ferroelectric Single Layer Capacitor by Retarded Domain Nucleation

Yu Jin Kim, Hyeon Woo Park, Seung Dam Hyun et al. · Nano Letters · 2017 · 78 citations

Natural Sciences, Materials Engineering, Materials Science +15

Dispersion in Ferroelectric Switching Performance of Polycrystalline Hf_0.5Zr_0.5O₂ Thin Films

Seung Dam Hyun, Hyeon Woo Park, Yu Jin Kim et al. · ACS Applied Materials & Interfaces · 2018 · 78 citations

Natural Sciences, Materials Engineering, Materials Science +17

A Comparative Study on the Ferroelectric Performances in Atomic Layer Deposited Hf0.5Zr0.5O2 Thin Films Using Tetrakis(ethylmethylamino) and Tetrakis(dimethylamino) Precursors

Baek Su Kim, Seung Dam Hyun, Taehwan Moon et al. · Nanoscale Research Letters · 2020 · 63 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17