Performance of a very high resolution soft x-ray beamline BL25SU with a twin-helical undulator at SPring-8

Y. Saitoh, Hiroaki Kimura, Yoshio Suzuki, +11

Review of Scientific Instruments

Optical MaterialsX-ray SpectroscopyEngineeringHigh ResolutionExcellent Performance +20

Contribution of electronic structure to the large thermoelectric power in layered cobalt oxides

Tsunehiro Takeuchi, Takeshi Kondo, Tsuyoshi Takami, +11

Physical Review B

EngineeringThermoelectricsElectronic StructureThermal ConductivitySemiconductors +14

Highly Coordinated Iron and Cobalt Nitrides Synthesized at High Pressures and High Temperatures

Ken Niwa, Toshiki Terabe, Daiki Kato, +4

Inorganic Chemistry

Discovery of the Last Remaining Binary Platinum‐Group Pernitride RuN₂

Ken Niwa, Kentaro Suzuki, Shunsuke Muto, +4

Chemistry - A European Journal

La-doped EuO: A rare earth ferromagnetic semiconductor with the highest Curie temperature

Hidetoshi Miyazaki, H.J. Im, Kensei Terashima, +5

Applied Physics Letters

Rare Earth MineralEngineeringCrystal Growth TechnologySolid-state ChemistryDoped La 5D +18

Thermoelectric properties of Heusler-type off-stoichiometric Fe₂V_1+<i>x</i>Al_1−<i>x</i>alloys

Hidetoshi Miyazaki, Suguru Tanaka, Naoki Ide, +2

Materials Research Express

Materials ScienceMaterials EngineeringMagnetic PropertiesCrystal StructureEngineering +11

Construction of two-dimensional photoelectron spectrometer at SPring-8

Masato Kotsugi, Yutaka Miyatake, Katsunari Enomoto, +12

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment

Two-dimensional Photoelectron SpectrometerPhysicsElectron SpectroscopyNatural SciencesSpectroscopy +2

Resonant photoemission studies of 3d transition metal intercalates of TiS2

Yuko Ueda, H. Negishi, Mikio Koyano, +4

Solid State Communications

Materials ScienceTransition Metal ChalcogenidesPhotoluminescenceEngineeringPhysics +4

Twin helical undulator beamline for soft X-ray spectroscopy at SPring-8

Y. Saitoh, Takeshi Nakatani, T. Matsushita, +10

Journal of Synchrotron Radiation

High ResolutionX-ray SpectroscopyEngineeringSynchrotron Radiation SourceOptical Properties +17

Determination of non-uniform graphene thickness on SiC (0001) by X-ray diffraction

Akkawat Ruammaitree, Hiroyuki Nakahara, K. Akimoto, +2

Applied Surface Science

Materials ScienceGraphene NanomeshesEngineeringX-ray DiffractionApplied Physics +5