Statistics
Publications
2
Citations
65
H-Index
2
Active since
1996
Mike Stover is an author specializing in design for testability, gate oxide degradation, and stress screening.
Publications per year
1996–1996
2
2
Evaluation of Early Failure Screening Methods
Terry Barrette, Vishwas Bhide, K. De et al. · 1996 · 33 citations
Engineering, Computer Engineering, Electrical Engineering +17
Evaluation of early failure screening methods [ASICs]
Terrence R. Barrette, Vishwas Bhide, K. De et al. · 1996 · 32 citations
Engineering, Computer Engineering, Electrical Engineering +16
1–2 of 2