Gwangsun Byun

Statistics

Publications

Citations

129

H-Index

Active since

2013

Affiliations

Samsung (South Korea)(Current)

JEOL (Japan)

Gwangsun Byun is an author at Samsung (South Korea) specializing in transmission electron microscopy strain mapping, engineering, and materials engineering.

Publications per year

2013–2013

Publications

Scanning moiré fringe imaging for quantitative strain mapping in semiconductor devices

Suhyun Kim, Sung-Ho Lee, Yoshifumi Oshima et al. · Applied Physics Letters · 2013 · 61 citations

Engineering, Materials Engineering, Materials Science +17

Quantitative measurement of strain field in strained-channel-transistor arrays by scanning moiré fringe imaging

Suhyun Kim, Yukihito Kondo, Kyungwoo Lee et al. · Applied Physics Letters · 2013 · 33 citations

Engineering, Electrical Engineering, Materials Engineering +17

Strained hetero interfaces in Si/SiGe/SiGe/SiGe multi-layers studied by scanning moiré fringe imaging

Suhyun Kim, Sung-Ho Lee, Yukihito Kondo et al. · Journal of Applied Physics · 2013 · 23 citations

Engineering, Materials Engineering, Materials Science +17

Reliable strain measurement in transistor arrays by robust scanning transmission electron microscopy

Suhyun Kim, Joong Jung Kim, Younheum Jung et al. · AIP Advances · 2013 · 12 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

1–4 of 4