Statistics
Publications
1
Citations
116
H-Index
1
Active since
1973
Affiliations
Hitachi (Japan)(Current)
Sadahiro Ikeda is an author at Hitachi (Japan) specializing in defect detection, defect inspection, and fault detection.
Publications per year
1973–1973
1
1
A process for detecting defects in complicated patterns
Masakazu Ejiri, Takeshi Uno, Michihiro Mese et al. · Computer Graphics and Image Processing · 1973 · 116 citations
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