Statistics
Publications
4
Citations
79
H-Index
4
Active since
1989
S. Hellman is an author at IBM (United States) specializing in soft x-ray optics, radiation measurement, and physics.
Publications per year
1989–1990
4
4
Soft-x-ray imaging with the 35 period undulator at the NSLS
Christopher Buckley, H. Rarback, R. Alforque et al. · Review of Scientific Instruments · 1989 · 22 citations · Full text
X-ray Microscopy with the NSLS Soft X-ray Undulator
Janos Kirz, Harald Ade, Erik Anderson et al. · Physica Scripta · 1990 · 10 citations
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