H. Enkisch

Enhanced reflectance of interface engineered Mo/Si multilayers produced by thermal particle deposition

Andrey Yakshin, Robbert Wilhelmus Elisabeth van de Kruijs, Ileana Nedelcu et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2007 · 48 citations

Engineering, Thin Film Process Technology, Silicon On Insulator +16

Nano-size crystallites in Mo/Si multilayer optics

Robbert Wilhelmus Elisabeth van de Kruijs, E. Zoethout, Andrey Yakshin et al. · Thin Solid Films · 2006 · 38 citations

Materials Science, Mo/si Multilayer Optics, Optical Materials +3

Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser

Igor Milov, Igor A. Makhotkin, R. Sobierajski et al. · Optics Express · 2018 · 37 citations · Full text

Momentum-transfer dependence of x-ray Raman scattering at the Be K-edge

Christian Sternemann, M. Volmer, J. A. Soininen et al. · Physical review. B, Condensed matter · 2003 · 35 citations

X-ray Crystallography, X-ray Spectroscopy, Engineering +17

Interface roughness in Mo/Si multilayers

Ileana Nedelcu, Robbert Wilhelmus Elisabeth van de Kruijs, Andrey Yakshin et al. · Thin Solid Films · 2006 · 34 citations

Engineering, Physics, Surface Science +5