D. Klinger

Spot size characterization of focused non-Gaussian X-ray laser beams

J. Chalupský, J. Krzywiński, L. Juha et al. · Optics Express · 2010 · 104 citations · Full text

Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure

A. R. Khorsand, R. Sobierajski, E. Louis et al. · Optics Express · 2010 · 68 citations · Full text

Optical Materials, Engineering, Silicon On Insulator +16

Photon energy dependence of graphitization threshold for diamond irradiated with an intense XUV FEL pulse

J. Gaudin, Nikita Medvedev, J. Chalupský et al. · Physical Review B · 2013 · 67 citations · Full text

Solid-to-solid Phase Transition, Engineering, Xuv Range +18

Ablation of solids using a femtosecond extreme ultraviolet free electron laser

Nikola M. Stojanović, D. von der Linde, K. Sokolowski-Tinten et al. · Applied Physics Letters · 2006 · 54 citations · Full text

Xuv Radiation, Engineering, Laser-plasma Interaction +19

Soft x-ray free electron laser microfocus for exploring matter under extreme conditions

A. J. Nelson, S. Toleikis, Henry N. Chapman et al. · Optics Express · 2009 · 44 citations · Full text