Statistics
Publications
1
Citations
11
H-Index
1
Active since
2004
Affiliations
Alain Wislez is an author at Centre National de la Recherche Scientifique specializing in defects in electronic materials, engineering, and cmos reliability.
Publications per year
2004–2004
1
1
ESD induced latent defects in CMOS ICs and reliability impact
Nicolas Guitard, David Trémouilles, S. Alves et al. · 2004 · 11 citations
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