Statistics
Publications
6
Citations
159
H-Index
6
Active since
2006
Affiliations
S. Slupsky is an author at Scanimetrics (Canada) specializing in microelectronics, electrical engineering, and engineering.
Publications per year
2006–2009
6
6
Non-contact wafer probe using wireless probe cards
C. Sellathamby, M. Reja, Lin Fu et al. · 2006 · 49 citations
Engineering, Computer Engineering, Electrical Engineering +16
Contactless testing: Possibility or pipe-dream?
Erik Jan Marinissen, Dae‐Young Lee, John P. Hayes et al. · 2009 · 32 citations
Engineering, Computer Engineering, Electrical Engineering +17
High throughput non-contact SiP testing
B. Moore, C. Sellathamby, Philippe Cauvet et al. · 2007 · 24 citations
Non-contact Testing for SoC and RCP (SIPs) at Advanced Nodes
B. Moore, Marc Mangrum, C. Sellathamby et al. · 2008 · 11 citations
Engineering, Computer Engineering, Electrical Engineering +17
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